X-ray Diffraction Solution for High Sample Throughput
The D4 ENDEAVOR is an X-ray Diffraction (XRD) Solution for the analysis of polycrystalline material by means of X-ray powder diffraction. The D4 ENDEAVOR performs qualitative and quantitative crystalline phase analysis, peak profile analysis, residual stress determination and structure solutions. As such it provides optimum performance for process and quality control in the aluminium, cement, chemistry, geology, pharmaceutical, and pigment industries.
Innovative 1-dimensional X-ray detectors
In addition to its proven accuracy, repeatability and reliability, the D4 ENDEAVOR features the modularity of the family of Bruker AXS Diffraction Solutions. The D4 ENDEAVOR can be equipped with innovative 1-dimensional X-ray detectors – LYNXEYE or VÅNTEC-1 – to provide an enormous reduction of measurement time per sample.
Fundamental parameter approach implemented into TOPAS
The unique TOPAS software converts the D4 ENDEAVOR into a real trailblazer. Quantitative X-ray diffraction analysis and micro-structure analysis can be executed without the need for standard samples due to the fundamental parameter approach implemented into TOPAS. In addition, complete automation with no need for user intervention is possible with TOPAS BBQ.
The D4 ENDEAVOR is easy to operate. The automation interface is clear and the sample loading is performed via a conveyor belt or robot. The D4 ENDEAVOR is equipped with the largest sample magazine available and allows a wide variety of different samples to be loaded in a single batch. The samples can be thin, small in size or amount, irregularly shaped, environmentally-sensitive, oriented powder, or typical powder.